Deadline extension: MBT 2010, Sixth Workshop on Model-Based Testing at ETAPS 2010

Sixth Workshop on Model-Based Testing March 21, 2010, Pathos, Cyprus http://react.cs.uni-sb.de/mbt2010/ DEADLINE EXTENSION: December 18, 2009 Satellite workshop of ETAPS 2010 FINAL CALL FOR PAPERS The workshop is devoted to model-based testing of both software and hardware. Model-based testing is closely related to model-based specification. Models are used to describe the behavior of the system under consideration and to guide such efforts as test selection and test results evaluation. Both testing and verification are used to validate models against the requirements and check that the implementation conforms to the specification model. Model-based testing has gained attention with the popularization of models in software/hardware design and development. Of particular importance are formal models with precise semantics, such as state-based formalisms. Testing with such models allows one to measure the degree of the product's conformance with the model. Techniques to support model-based testing are drawn from diverse areas, like formal verification, model checking, control and data flow analysis, grammar analysis, and Markov decision processes. The intent of this workshop is to bring together researchers and users of models for to discuss the state of the art in theory, applications, tools, and industrialization of model-based specification, testing and verification. WORKSHOP HISTORY MBT 2010 is the sixth event in a series of ETAPS satellite workshops. MBT 2004, historically the first meeting to focus on model-based testing, was held March 27-28, 2004, in Barcelona, Spain. MBT 2006 was held in Vienna, Austria, MBT 2007 in Braga, Portugal, MBT 2008 in Budapest, Hungary, and MBT 2009 in York, UK. The proceedings have appeared in ENTCS (volumes 111,164,190,220,253). SUBMISSION TOPICS Original submissions are solicited from industry and academia. They are invited to present their work, plans, and views related to model-based testing. The topics of interest include but are not limited to: * Online and offline test sequence generation methods and tools * Test data selection methods and tools * Runtime verification * Model-based test coverage metrics * Automatic domain/partition analysis * Combination of verification and testing * Models as test oracles * Scenario based test generation * Meta programming support for testing * Formalisms suitable for model-based specification and testing * Application of model checking techniques in model-based testing * Game-theoretic approaches to testing * Model-based testing in industry: problems and achievements IMPORTANT DATES Paper submissions: December 18, 2009 ** extended deadline ** Notification of acceptance: February 1, 2010 Final versions: February 15, 2010 PAPER SUBMISSION Research papers should be limited to 15 pages in ENTCS format, describing significant research results based on sound theory or experimental assessment. We also solicit industry experience papers, about the use of model-based testing in industrial environments. Such papers should be limited to 15 pages, too. Paper submission is now open at http://www.easychair.org/conferences/?conf=mbt2010 Workshop proceedings will be distributed by the organizers of ETAPS 2010. It is intended also that selected contributions will be published in a journal. WEBSITE http://react.cs.uni-sb.de/mbt2010/ PROGRAM COMMITTEE Bernhard K. Aichernig (Graz University of Technology, Austria) Jonathan Bowen (Museophile Limited, UK) Mirko Conrad (The MathWorks GmbH, Germany) Bernd Finkbeiner (Universitaet des Saarlandes, Germany) Patrice Godefroid (Microsoft Research) Yuri Gurevich (Microsoft Research, USA) Ziyad Hanna (Jasper Design Automation, USA) Antti Huima (Conformiq Software Ltd., Finland) Darko Marinov (University of Illinois, USA) Bruno Marre (Universite Paris-Sud, France) Alexander K. Petrenko (ISP RAS, Russia) Alexandre Petrenko (Computer Research Institute of Montreal, Canada) Natasha Sharygina (University of Lugano, Switzerland) Nikolai Tillmann (Microsoft Research, USA) Jan Tretmans (Embedded Systems Institute, Eindhoven, The Netherlands) Nina Yevtushenko (Tomsk State University, Russia)