Tuesday, December 8, 2009

CfP: A-MOST 2010

CALL FOR PAPERS A-MOST 2010: 6th International Workshop on Advances in Model Based Testing Co-located with ICST 2010 (3nd International Conference on Software Testing, Verification and Validation) April 6, 2010, Paris, France http://a-most.iese.fraunhofer.de/10/ The increasing use of software and the growing system complexity, in size, heterogeneity, autonomy, physical distribution, and dynamicity make focused software system testing a challenging task. Recent years have seen an increasing industrial and academic interest in the use of models for designing and testing software. Success has been reported using a range of types of models using a variety of specification formats, notations and formal languages, such as UML, SDL, B and Z. The goal of the A-MOST workshop is to bring together researchers and practitioners to discuss the current state of the art and practice as well as future prospects for Model-Based software Testing (MBT). Topics of interest for the Workshop include (but are not limited to): Models: - Models for component, integration and system testing - Product-line models - (Hybrid) embedded system models - Systems-of-systems models - Architectural models - Models for orchestration and choreography of services - Executable models and simulation - Environment and use models - Non-functional models - Models of SUT, properties and environments Processes, Methods and Tools: - Model-based test generation algorithms - Application of model checking techniques in model-based testing - Tracing from requirements model to test models - Performance and predictability of model-driven development - Test model evolution during the software lifecycle - Risk-based approaches for MBT - Generation of testing-infrastructures from models - Combinatorial approaches for MBT - Statistical testing Experiences and Evaluation: - Non-functional/Quantitative MBT - Estimating dependability (e.g., security, safety, reliability) using MBT - Coverage metrics and measurements for structural and (non-)functional models - Cost of testing, economic impact of MBT - Empirical validation, experiences, case studies using MBT Submissions: We invite submissions of full-length papers that describe new research, tools, technologies, and industry experience, as well as position papers. Papers *must* be submitted in PDF format and *must* not exceed eight pages (including all text, figures, references and appendices). Each submitted paper must conform to the IEEE Format and Submission Guidelines and use the IEEE Journal style. Check the webpage for further details: http://a-most.iese.fraunhofer.de/10/ Proceedings: Workshop Proceedings will be published in the IEEE Digital Library. We are currently in discussions with the editor of a journal regarding the possibility of authors of selected papers being invited to submit an extended paper for a Special Issue. Important Dates: Submission Deadline: January 22, 2010 Notification: February 27, 2010 Camera-Ready: March 20, 2010 Workshop: April 1, 2010 Organization: Robert Eschbach, Fraunhofer IESE, Germany Jesse H. Poore, University of Tennessee, USA Programme Committee: Paul Ammann Mikhail Auguston Bob Binder Steve Counsell Lars Frantzen Gordon Fraser Angelo Gargantini Wolfgang Grieskamp Rob Hierons Antti Huima Mercedes Merayo Brian Nielsen Manuel Nunez Ioannis Parissis Alexandre Petrenko Alexander Pretschner Hasan Ural Carsten Weise Franz Wotawa Robert Eschbach Jeff Offutt Jesse Poore Ina Schieferdecker Stacy Prowell Further members to be announced Steering Committee: Lionel Briand, Simula Research Laboratory, Norway Rob Hierons, Brunel University, UK Manuel Nunez, Universidad Complutense de Madrid, Spain Alexander Pretschner, Fraunhofer IESE, Germany -- Dr. Robert Eschbach, Fraunhofer IESE, Department "Testing and Inspections", Department Head, Fraunhofer-Platz 1, 67663 Kaiserslautern, Germany Phone/Fax: +49 631 6800-2105/-1899 Mobile: +49 171 761 9764 mailto:robert.eschbach@iese.fraunhofer.de http://tai.iese.fraunhofer.de

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