CfP: A-MOST 2010
CALL FOR PAPERS
A-MOST 2010:
6th International Workshop on Advances in Model Based Testing
Co-located with ICST 2010
(3nd International Conference on Software Testing, Verification and
Validation)
April 6, 2010, Paris, France
http://a-most.iese.fraunhofer.de/10/
The increasing use of software and the growing system complexity, in
size, heterogeneity, autonomy, physical distribution, and dynamicity
make focused software system testing a challenging task. Recent years
have seen an increasing industrial and academic interest in the use of
models for designing and testing software. Success has been reported
using a range of types of models using a variety of specification
formats, notations and formal languages, such as UML, SDL, B and Z.
The goal of the A-MOST workshop is to bring together researchers and
practitioners to discuss the current state of the art and practice as
well as future prospects for Model-Based software Testing (MBT).
Topics of interest for the Workshop include (but are not limited to):
Models:
- Models for component, integration and system testing
- Product-line models
- (Hybrid) embedded system models
- Systems-of-systems models
- Architectural models
- Models for orchestration and choreography of services
- Executable models and simulation
- Environment and use models
- Non-functional models
- Models of SUT, properties and environments
Processes, Methods and Tools:
- Model-based test generation algorithms
- Application of model checking techniques in model-based testing
- Tracing from requirements model to test models
- Performance and predictability of model-driven development
- Test model evolution during the software lifecycle
- Risk-based approaches for MBT
- Generation of testing-infrastructures from models
- Combinatorial approaches for MBT
- Statistical testing
Experiences and Evaluation:
- Non-functional/Quantitative MBT
- Estimating dependability (e.g., security, safety, reliability)
using MBT
- Coverage metrics and measurements for structural and
(non-)functional models
- Cost of testing, economic impact of MBT
- Empirical validation, experiences, case studies using MBT
Submissions:
We invite submissions of full-length papers that describe new research,
tools, technologies, and industry experience, as well as position
papers. Papers *must* be submitted in PDF format and *must* not exceed
eight pages (including all text, figures, references and appendices).
Each submitted paper must conform to the IEEE Format and Submission
Guidelines and use the IEEE Journal style.
Check the webpage for further details:
http://a-most.iese.fraunhofer.de/10/
Proceedings:
Workshop Proceedings will be published in the IEEE Digital Library.
We are currently in discussions with the editor of a journal regarding
the possibility of authors of selected papers being invited to submit an
extended paper for a Special Issue.
Important Dates:
Submission Deadline: January 22, 2010
Notification: February 27, 2010
Camera-Ready: March 20, 2010
Workshop: April 1, 2010
Organization:
Robert Eschbach, Fraunhofer IESE, Germany
Jesse H. Poore, University of Tennessee, USA
Programme Committee:
Paul Ammann
Mikhail Auguston
Bob Binder
Steve Counsell
Lars Frantzen
Gordon Fraser
Angelo Gargantini
Wolfgang Grieskamp
Rob Hierons
Antti Huima
Mercedes Merayo
Brian Nielsen
Manuel Nunez
Ioannis Parissis
Alexandre Petrenko
Alexander Pretschner
Hasan Ural
Carsten Weise
Franz Wotawa
Robert Eschbach
Jeff Offutt
Jesse Poore
Ina Schieferdecker
Stacy Prowell
Further members to be announced
Steering Committee:
Lionel Briand, Simula Research Laboratory, Norway
Rob Hierons, Brunel University, UK
Manuel Nunez, Universidad Complutense de Madrid, Spain
Alexander Pretschner, Fraunhofer IESE, Germany
--
Dr. Robert Eschbach, Fraunhofer IESE, Department "Testing and
Inspections", Department Head, Fraunhofer-Platz 1, 67663 Kaiserslautern,
Germany
Phone/Fax: +49 631 6800-2105/-1899
Mobile: +49 171 761 9764
mailto:robert.eschbach@iese.fraunhofer.de
http://tai.iese.fraunhofer.de
Labels: call for papers, cfp, conf, conference, conferences, research

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