CfP: Mutation 2010 - 5th International Workshop on Mutation Analysis

CALL FOR PAPERS Mutation 2010: The 5th International Workshop on Mutation Analysis April 6, 2010, Paris, France http://www.st.cs.uni-saarland.de/mutation2010 Co-located with ICST 2010 (3rd International Conference on Software Testing, Verification and Validation) About Mutation 2010: Mutation is acknowledged as an important way to assess the fault-finding effectiveness of tests sets. Mutation testing has mostly been applied at the source code level, but more recently, related ideas have also been used to test artifacts described in a considerable variety of notations and at different levels of abstraction. Mutation ideas are used with requirements, formal specifications, architectural design notations, informal descriptions (e.g. use cases) and hardware. Mutation is now established as a major concept in software and systems V&V and uses of mutation are increasing. The goal of the Mutation workshop is to provide a forum for researchers and practitioners to discuss new and emerging trends in mutation analysis. We invite submissions of both full-length and short-length. Keynote Speaker: Mark Harman, King's College, UK - "How HOM Helps Mutation Testing" Topics of interest: - Mutation-based test adequacy criteria (theory or practical application). - Mutation testing using higher order mutants. - Test-case generation using mutants. - Using mutation in empirical studies (e.g. studies that compare mutation with other testing techniques). - Industrial experience with mutation. - New mutation systems for programming languages (e.g. for languages not yet addressed, or offering improvements on existing ones) and for higher-level descriptive notations (e.g. formal specification notations and architectural design notations). - Novel applications of mutation including mutation for QoS properties (security, performance, etc.). Submissions & Publication: Two types of papers can be submitted to the workshop: - Full papers (10 pages): Research, case studies - Short papers (6 pages): Research in progress, tools, experience reports, problem descriptions, new ideas Each submitted paper must conform to the IEEE format and submission guidelines. Submissions will be evaluated according to the relevance and originality of the work and to their ability to generate discussions between the participants of the workshop. Each paper will be reviewed by three reviewers, and accepted papers will be published in the IEEE Digital Library. SCP Special Issue: Authors of selected papers will be invited to submit extended versions of their papers to a special issue of the journal Science of Computer Programming (SCP). Important Dates: Submission of full papers: January 15, 2010 Notification of acceptance: March 2, 2010 Camera-Ready: March 26, 2010 Date of workshop: April 6, 2010 Organization: Lydie du Bousquet, Laboratoire d'Informatique de Grenoble (LIG), France Jeremy S Bradbury, University of Ontario Institute of Technology, Canada Gordon Fraser, Saarland University, Germany Program Committee: Roger Alexander, Washington State University, USA Paul Ammann, George Mason University, USA Benoit Baudry, INRIA, France Leonardo Bottaci, University of Hull, UK Byoungju Choi, EWHA Womans University, South Korea John A Clark, University of York, UK James R Cordy, Queen's University, Canada Rich DeMillo, Georgia Tech, USA Mark Harman, King's College, UK Mark Hampton Rob Hierons, Brunel University, UK Bill Howden, University of California at San Diego, USA Jose Carlos Maldonado, Universidade de Sao Paolo, Brasil Mercedes Merayo,Universidad Complutense de Madrid, Spain Phil McMinn, University of Sheffield, UK Akbar Siami Namin, Texas Tech University, USA Jeff Offutt, George Mason University, USA Macario Polo, University of Castilla-La Mancha, Spain David Schuler, Saarland University, Germany Yves Le Traon, University of Luxembourg, Luxembourg Laurie Williams, North Carolina State University, USA Eric Wong,University of Texas at Dallas, USA Lu Zhang, Peking University, China